Super-resolution electron ptychography of low dimensional materials at 30 keV: Beyond the detector limit (2023)
Abstract
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Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/5.0143684
Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85165231593
Type: Journal Article/Review
Parent Publication: Applied Physics Letters
Issue: 2