Millimeter-Wave On-Wafer Large Signal Characterization System for Harmonic Source/Load Pull and Waveform Measurements (2023)
Attributed to:
Non-linear (large signal) Millimetre-wave Devices, Circuits and Systems On-Wafer Characterization Facility
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/ims37964.2023.10187929
Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85168543666
Type: Conference/Paper/Proceeding/Abstract