Temperature-induced step-like enhancement of drain current in a two-dimensional ReS2 field-effect transistor (2023)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/nmdc57951.2023.10343986

Publication URI: https://api.elsevier.com/content/abstract/scopus_id/85182020444

Type: Conference/Paper/Proceeding/Abstract