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Understanding the limits of a hall sensor sensitivity for integration on a GaN power transistor chip: experiments with market available components (2023)

First Author: Marsic V

Attributed to: Gallium Nitride Smart Power Integrated Circuit Technology (GaN SPICe) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1049/icp.2023.2022

Publication URI: http://dx.doi.org/10.1049/icp.2023.2022

Type: Journal Article/Review

Parent Publication: IET Conference Proceedings

Issue: 17