Understanding the limits of a hall sensor sensitivity for integration on a GaN power transistor chip: experiments with market available components (2023)
Attributed to:
Gallium Nitride Smart Power Integrated Circuit Technology (GaN SPICe)
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1049/icp.2023.2022
Publication URI: http://dx.doi.org/10.1049/icp.2023.2022
Type: Conference/Paper/Proceeding/Abstract