Scattering-type Near-Field Optical Microscopy Characterization of Topological Insulator Bi 2 Te 3 nanowires (2023)

First Author: Johnson D
Attributed to:  Sir Henry Royce InsStitute - recurrent grant funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/irmmw-thz57677.2023.10299204

Publication URI: http://dx.doi.org/10.1109/irmmw-thz57677.2023.10299204

Type: Conference/Paper/Proceeding/Abstract