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Direct visualization of chemical transport in solid-state chemical reactions by time-of-flight secondary ion mass spectrometry (2024)

First Author: Pham S

Attributed to: Nanoscale photophysics at defects and interfaces in organic semiconductors funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.26434/chemrxiv-2024-whvl8

Publication URI: http://dx.doi.org/10.26434/chemrxiv-2024-whvl8

Type: Preprint