AlN thin film transducers for high temperature non-destructive testing applications (2012)
Attributed to:
High temperature ultrasonic measurements of plant and components for defect detection and monitoring
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/1.3700345
Publication URI: http://dx.doi.org/10.1063/1.3700345
Type: Journal Article/Review
Parent Publication: Journal of Applied Physics
Issue: 7
ISSN: 00218979