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Transparent Ta doped SnO2 films deposited by RF co-sputtering (2018)

First Author: Featherstone T

Attributed to: X-RAY DIFFRACTION CAPABILITY FOR NANOSCALE AND THIN FILM STRUCTURE funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/pvsc.2018.8547755

Publication URI: http://dx.doi.org/10.1109/pvsc.2018.8547755

Type: Conference/Paper/Proceeding/Abstract