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Microscopic KMC Modeling of Oxide RRAMs

First Author: Sadi T

Attributed to: Resistive switches (RRAM) and memristive behaviour in silicon-rich silicon oxides funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1007/978-3-030-10692-8_32

Publication URI: http://dx.doi.org/10.1007/978-3-030-10692-8_32

Type: Book Chapter

Book Title: Numerical Methods and Applications - 9th International Conference, NMA 2018, Borovets, Bulgaria, August 20-24, 2018, Revised Selected Papers (2019)

Page Reference: 290-297

ISSN: 16113349 03029743