Time Resolved Hyperspectral Quantum Rod Thermography of Microelectronic Devices: Temperature Transients in a GaN HEMT (2020)

Abstract

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Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/led.2020.2989919

Publication URI: http://dx.doi.org/10.1109/led.2020.2989919

Type: Journal Article/Review

Parent Publication: IEEE Electron Device Letters

Issue: 6

ISSN: 15580563 07413106