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An Interferometric Characterization Technique for Extreme Impedance Microwave Devices (2020)

First Author: Votsi H

Attributed to: University of Surrey- Equipment Account funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/arftg47584.2020.9071748

Publication URI: http://dx.doi.org/10.1109/arftg47584.2020.9071748

Type: Conference/Paper/Proceeding/Abstract