Molecular dynamics simulation of AFM tip-based hot scratching of nanocrystalline GaAs (2021)
Attributed to:
HETEROSTRUCTURE RADIATION DETECTOR MATERIALS FOR ADVANCED TIME OF FLIGHT POSITRON EMISSION TOMOGRAPHY (TOF-PET) IMAGING
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.mssp.2021.105832
Publication URI: http://dx.doi.org/10.1016/j.mssp.2021.105832
Type: Journal Article/Review
Parent Publication: Materials Science in Semiconductor Processing
ISSN: 13698001