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Modelling of the Gate Capacitance in the Double Nanowire based Field-Effect Transistors (2021)

First Author: Liu F

Attributed to: 'Hetero-print': A holistic approach to transfer-printing for heterogeneous integration in manufacturing funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/fleps51544.2021.9469836

Publication URI: http://dx.doi.org/10.1109/fleps51544.2021.9469836

Type: Conference/Paper/Proceeding/Abstract