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Investigating GaN power device double-pulse testing efficacy in the face of V TH -shift, dynamic R dson , and temperature variations (2021)

First Author: Hedayati M

Attributed to: Reliability, Condition Monitoring and Health Management Technologies for WBG Power Modules funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/apec42165.2021.9487358

Publication URI: http://dx.doi.org/10.1109/apec42165.2021.9487358

Type: Conference/Paper/Proceeding/Abstract