Characterisation of 200 mm GaAs and Ge substrate VCSELs for high-volume manufacturing (2023)
Attributed to:
Future Compound Semiconductor Manufacturing Hub
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1117/12.2648442
Publication URI: http://dx.doi.org/10.1117/12.2648442
Type: Conference/Paper/Proceeding/Abstract