Direct Observation of Contact Reaction Induced Ion Migration and its Effect on Non-Ideal Charge Transport in Lead Triiodide Perovskite Field-Effect Transistors (2023)

First Author: Zhang Y
Attributed to:  Frontier Engineering: Progression Grant in Nature-Inspired Engineering funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/smll.202302494

Publication URI: http://dx.doi.org/10.1002/smll.202302494

Type: Journal Article/Review

Parent Publication: Small

Issue: 41