Silicon as a model ion trap: time domain measurements of donor Rydberg states (2008)
Attributed to:
Far Infra-Red Emission and Lasing in Doped Semiconductors
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.0812.0148
Publication URI: https://arxiv.org/abs/0812.0148
Type: Other