Hydrogen and the Light-Induced Bias Instability Mechanism in Amorphous Oxide Semiconductors. (2017)

First Author: Li H

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.17863/cam.16730

Publication URI: https://www.repository.cam.ac.uk/handle/1810/273214

Type: Journal Article/Review