Ultrafast perturbation maps as a quantitative tool for testing of multi-port photonic devices (2018)
Attributed to:
Silicon Photonics for Future Systems
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.1802.06600
Publication URI: https://arxiv.org/abs/1802.06600
Type: Other