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The Over-Reset Phenomenon in Ta2O5 RRAM Device Investigated by the RTN-Based Defect Probing Technique (2018)

First Author: Chai Z

Attributed to: Variability-aware RRAM PDK for design based research on FPGA/neuro computing funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.17863/cam.34421

Publication URI: https://www.repository.cam.ac.uk/handle/1810/287112

Type: Journal Article/Review