In-situ sputtering from the micromanipulator to enable cryogenic preparation of specimens for atom probe tomography by focused-ion beam (2022)
Attributed to:
Nanoscale Advanced Materials Engineering
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.2211.06877
Publication URI: https://arxiv.org/abs/2211.06877
Type: Other