In-situ sputtering from the micromanipulator to enable cryogenic preparation of specimens for atom probe tomography by focused-ion beam (2022)

First Author: Douglas J
Attributed to:  Nanoscale Advanced Materials Engineering funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.2211.06877

Publication URI: https://arxiv.org/abs/2211.06877

Type: Other