Putting high-index Cu on the map for high-yield, dry-transferred CVD graphene (2022)
Attributed to:
Expanding the Environmental Frontiers of Operando Metrology for Advanced Device Materials Development
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.2209.08007
Publication URI: https://arxiv.org/abs/2209.08007
Type: Other