Self-interaction error induces spurious charge transfer artefacts in core-level simulations of x-ray photoemission and absorption spectroscopy of metal-organic interfaces (2021)
Attributed to:
Proposal for a Tier 2 Centre - HPC Midlands Plus
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.2112.00876
Publication URI: https://arxiv.org/abs/2112.00876
Type: Preprint