Defect-induced nonlinearity in 2D nanoparticles (2021)
Attributed to:
Next Generation Metrology Driven by Nanophotonics
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.2109.10308
Publication URI: https://arxiv.org/abs/2109.10308
Type: Other