Perfectly-matched-layer truncation is exponentially accurate at high frequency (2021)

First Author: Galkowski J
Attributed to:  High energy spectral and scattering phenomena via microlocal analysis funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.2105.07737

Publication URI: https://arxiv.org/abs/2105.07737

Type: Preprint