📣 Try out the NEW Gateway to Research and let us know what you think.

We're looking for users to test the new service during August and September and share their feedback. Express your interest by completing this short form.

A Stein Goodness of fit Test for Exponential Random Graph Models (2021)

First Author: Xu W

Attributed to: Application driven Topological Data Analysis funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.2103.00580

Publication URI: https://arxiv.org/abs/2103.00580

Type: Other