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Atomic-Scale Patterning of Arsenic in Silicon by Scanning Tunneling Microscopy (2019)

First Author: Stock T

Attributed to: Atomically Deterministic Doping and Readout For Semiconductor Solotronics (ADDRFSS) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.1910.06685

Publication URI: https://arxiv.org/abs/1910.06685

Type: Preprint