Forescattered electron imaging of nanoparticles in a scanning electron microscopy (2019)

First Author: Liu J

Attributed to: Strategic Equipment - a Dual Beam FIB/SEM with large area patterning, EBSD and nanoprobe capabilities funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.1904.05660

Publication URI: https://arxiv.org/abs/1904.05660

Type: Other