The origin of negative charging in amorphous Al$_2$O$_3$ films: The role of native defects (2018)

First Author: Dicks O

Attributed to: Resistive switches (RRAM) and memristive behaviour in silicon-rich silicon oxides funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.1811.00610

Publication URI: https://arxiv.org/abs/1811.00610

Type: Other