Mechanisms of Silicon Surface Passivation by Negatively Charged Hafnium Oxide Thin Films (2023)
Attributed to:
Charged oxide inversion layer (COIL) solar cells
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.24406/publica-865
Publication URI: https://publica.fraunhofer.de/handle/publica/435809
Type: Other