The effect of facet lines on critical current density and trapped field in bulk RE-Ba-Cu-O single grains (2022)

First Author: Shi Y

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.17863/cam.87468

Publication URI: https://www.repository.cam.ac.uk/handle/1810/340039

Type: Journal Article/Review