Carrier dynamics at trench defects in InGaN/GaN quantum wells revealed by time-resolved cathodoluminescence. (2022)
Attributed to:
Time-resolved cathodoluminescence scanning electron microscope
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.17863/cam.78991
Publication URI: https://www.repository.cam.ac.uk/handle/1810/331537
Type: Journal Article/Review