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BETSEE: testing for system-wide effects of single event effects on ITk strip modules (2023)

First Author: Belanger-Champagne C

Attributed to: ATLAS Upgrade 2018 Phase-II Construction funded by STFC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1748-0221/18/01/c01019

Publication URI: http://dx.doi.org/10.1088/1748-0221/18/01/c01019

Type: Journal Article/Review

Parent Publication: Journal of Instrumentation

Issue: 01