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Nature of Cu Interstitials in Al2O3 and the Implications for Filament Formation in Conductive Bridge Random Access Memory Devices (2016)

First Author: Dawson J

Attributed to: Mechanisms and Control of Resistive Switching in Dielectrics funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.17863/cam.6593

Publication URI: https://www.repository.cam.ac.uk/handle/1810/261409

Type: Journal Article/Review