Analysis of the Conduction Mechanism and Copper Vacancy Density in p-type Cu$_{2}$O Thin Films (2017)

First Author: Han S
Attributed to:  The Physics and Engineering of Oxide Semiconductors for Large-Area CMOS funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.17863/cam.10270

Publication URI: https://www.repository.cam.ac.uk/handle/1810/264749

Type: Journal Article/Review