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Fast, Non-Contact, Wafer-Scale, Atomic Layer Resolved Imaging of 2D Materials by Ellipsometric Contrast Micrography (2018)

First Author: Braeuninger-Weimer P

Attributed to: Graphene Sensors for Food Allergen Detection funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.17863/cam.27272

Publication URI: https://www.repository.cam.ac.uk/handle/1810/279904

Type: Journal Article/Review