Probing the Topological Surface State in Bi2Se3 Thin Films Using Temperature-Dependent Terahertz Spectroscopy (2017)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.17863/cam.35090

Publication URI: https://www.repository.cam.ac.uk/handle/1810/287776

Type: Journal Article/Review