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Defects in complex oxide thin films for electronics and energy applications: challenges and opportunities (2020)

First Author: Li W

Attributed to: Equipment Account: Integrated Thin Film Deposition and Analysis System funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.17863/cam.55382

Publication URI: https://www.repository.cam.ac.uk/handle/1810/308291

Type: Journal Article/Review