📣 Help Shape the Future of UKRI's Gateway to Research (GtR)

We're improving UKRI's Gateway to Research and are seeking your input! If you would be interested in being interviewed about the improvements we're making and to have your say about how we can make GtR more user-friendly, impactful, and effective for the Research and Innovation community, please email gateway@ukri.org.

Defects in complex oxide thin films for electronics and energy applications: Challenges and opportunities (2020)

First Author: Li W

Attributed to: Equipment Account: Integrated Thin Film Deposition and Analysis System funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.17863/cam.55382

Publication URI: https://www.repository.cam.ac.uk/handle/1810/308291

Type: Journal Article/Review