Methods and Applications for Nanometrology using Scanning Precession Electron Diffraction (2022)
Attributed to:
Electron Diffraction Based Nano-Metrology
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.17863/cam.93907
Publication URI: https://www.repository.cam.ac.uk/handle/1810/346488
Type: Thesis