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Comprehensive study of Raman optical response of typical substrates for thin-film growth under 633 nm and 785 nm laser excitation. (2023)

First Author: Jan A

Attributed to: ECCS - EPSRC Development of uniform, low power, high density resistive memory by vertical interface and defect design funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.17863/cam.101696

Publication URI: https://www.repository.cam.ac.uk/handle/1810/357528

Type: Journal Article/Review