Nanoscale Characterisation of Heterointerfaces in 2D Materials (2023)

First Author: Ramsden H

Attributed to: Expanding the Environmental Frontiers of Operando Metrology for Advanced Device Materials Development funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.17863/cam.105989

Publication URI: https://www.repository.cam.ac.uk/handle/1810/364241

Type: Thesis