Imaging Threading Dislocations and Surface Steps in Nitride Thin Films Using Electron Backscatter Diffraction. (2023)

First Author: Hiller KP

Attributed to: Ultra-Stable High-Performance Single Nanolasers funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1093/micmic/ozad118

PubMed Identifier: 37947075

Publication URI: http://europepmc.org/abstract/MED/37947075

Type: Journal Article/Review

Volume: 29

Parent Publication: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

Issue: 6

ISSN: 1431-9276