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Atom-by-Atom STEM Investigation of Defect Engineering in Graphene (2014)

First Author: Ramasse Q

Attributed to: In-Situ TEM Studies of Ion-Irradiated Materials funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1017/s1431927614010411

Publication URI: http://dx.doi.org/10.1017/s1431927614010411

Type: Journal Article/Review

Parent Publication: Microscopy and Microanalysis

Issue: S3