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Understanding radiation-generated electronic traps in radiation dosimeters based on organic field-effect transistors (2024)

First Author: Dremann D

Attributed to: XMaS: The UK Materials Science Facility at the ESRF funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1039/d3mh01507f

PubMed Identifier: 37937385

Publication URI: http://europepmc.org/abstract/MED/37937385

Type: Journal Article/Review

Parent Publication: Materials Horizons

Issue: 1

ISSN: 2051-6347