Scattering-type Near-Field Optical Microscopy Characterization of Topological Insulator Bi 2 Te 3 nanowires (2023)
Attributed to:
Cryogenic Ultrafast Scattering-type Terahertz-probe Optical-pump Microscopy (CUSTOM)
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/irmmw-thz57677.2023.10299204
Publication URI: http://dx.doi.org/10.1109/irmmw-thz57677.2023.10299204
Type: Conference/Paper/Proceeding/Abstract