Scattering-type Near-Field Optical Microscopy Characterization of Topological Insulator Bi 2 Te 3 nanowires (2023)
Abstract
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Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/irmmw-thz57677.2023.10299204
Publication URI: http://dx.doi.org/10.1109/irmmw-thz57677.2023.10299204
Type: Conference/Paper/Proceeding/Abstract