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Spatially Resolved High Voltage Kelvin Probe Force Microscopy: A Novel Avenue for Examining Electrical Phenomena at Nanoscale (2024)

First Author: McCluskey C

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/apxr.202400011

Publication URI: http://dx.doi.org/10.1002/apxr.202400011

Type: Journal Article/Review

Parent Publication: Advanced Physics Research

Issue: 7