Spatially Resolved High Voltage Kelvin Probe Force Microscopy: A Novel Avenue for Examining Electrical Phenomena at Nanoscale (2024)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1002/apxr.202400011
Publication URI: http://dx.doi.org/10.1002/apxr.202400011
Type: Journal Article/Review
Parent Publication: Advanced Physics Research