Spatially Resolved High Voltage Kelvin Probe Force Microscopy: A Novel Avenue for Examining Electrical Phenomena at Nanoscale (2024)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/apxr.202400011

Publication URI: http://dx.doi.org/10.1002/apxr.202400011

Type: Journal Article/Review

Parent Publication: Advanced Physics Research