Secondary Emission Monitor Simulation, Measurements and Machine Learning Application Studies for CERN Fixed Target Beamlines (2022)
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.18429/jacow-ibic2022-wep32
Publication URI: https://jacow.org/ibic2022/doi/JACoW-IBIC2022-WEP32.html
Type: Conference/Paper/Proceeding/Abstract